Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at nanoscale

Activity: Talk or presentation types › Oral presentation

Description

Contributed Talk
Period25 Jul 2023
Event titleISAF-ISIF-PFM 2023
Event typeConference
LocationCleveland, United States, OhioShow on map
Degree of RecognitionInternational