Abstract
The piezoresistance effect is defined as change in resistance due to applied stress. Silicon has a relatively large piezoresistance effect which has been known since 1954. A four point bending setup is proposed and designed to analyze the piezoresistance effect in p-type silicon. This setup is used to apply uniform and uniaxial stress along the <110> crystal direction. The main aim of this work is to investigate the piezoresistive characteristic of p-type resistors as a function of doping concentrations using COMSOL Multiphysics. Simulation results are compared with experimental data.
Original language | English |
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Number of pages | 5 |
Publication status | Published - 2013 |
Event | Proceedings of 2013 COMSOL Conference - Rotterdam, Netherlands Duration: 23 Oct 2015 → 25 Oct 2015 |
Conference
Conference | Proceedings of 2013 COMSOL Conference |
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Country/Territory | Netherlands |
City | Rotterdam |
Period | 23/10/2015 → 25/10/2015 |