A DIRECT INVERSION METHOD FOR SURFACE-STRUCTURE DETERMINATION FROM LEED INTENSITIES

P. Hu, DA KING, Peijun Hu

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

LOW-ENERGY electron diffraction (LEED) has become the most successful technique in surface crystallography1, but because of the complexity of the surface-electron scattering interactions, analyses of LEED data are still conducted on a trial-and-error basis: a direct-inversion method for treating LEED intensity data remains an attractive goal2. Building on recent theoretical and experimental developments in electron holography from surface structures3-16, we show here that three-dimensional images with atomic resolution can be obtained by a direct transform of conventional LEED intensity spectra.

Original languageEnglish
Pages (from-to)655-658
Number of pages4
JournalNature
Volume360
Issue number6405
Publication statusPublished - 17 Dec 1992

Keywords

  • ELECTRON-DIFFRACTION
  • MULTIPLE-SCATTERING
  • HOLOGRAPHIC IMAGES
  • CRYSTALLOGRAPHY
  • PHOTOEMISSION
  • TRANSFORM
  • PATTERNS

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