A DIRECT INVERSION METHOD FOR SURFACE-STRUCTURE DETERMINATION FROM LEED INTENSITIES

P. Hu; DA KING; Peijun Hu

A DIRECT INVERSION METHOD FOR SURFACE-STRUCTURE DETERMINATION FROM LEED INTENSITIES

P. Hu
, DA KING
, Peijun Hu

School of Chemistry and Chemical Engineering

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

LOW-ENERGY electron diffraction (LEED) has become the most successful technique in surface crystallography1, but because of the complexity of the surface-electron scattering interactions, analyses of LEED data are still conducted on a trial-and-error basis: a direct-inversion method for treating LEED intensity data remains an attractive goal2. Building on recent theoretical and experimental developments in electron holography from surface structures3-16, we show here that three-dimensional images with atomic resolution can be obtained by a direct transform of conventional LEED intensity spectra.

Original language	English
Pages (from-to)	655-658
Number of pages	4
Journal	Nature
Volume	360
Issue number	6405
Publication status	Published - 17 Dec 1992

Keywords

ELECTRON-DIFFRACTION
MULTIPLE-SCATTERING
HOLOGRAPHIC IMAGES
CRYSTALLOGRAPHY
PHOTOEMISSION
TRANSFORM
PATTERNS

Cite this

@article{790425ecd2934f10902568e789e49cf3,

title = "A DIRECT INVERSION METHOD FOR SURFACE-STRUCTURE DETERMINATION FROM LEED INTENSITIES",

abstract = "LOW-ENERGY electron diffraction (LEED) has become the most successful technique in surface crystallography1, but because of the complexity of the surface-electron scattering interactions, analyses of LEED data are still conducted on a trial-and-error basis: a direct-inversion method for treating LEED intensity data remains an attractive goal2. Building on recent theoretical and experimental developments in electron holography from surface structures3-16, we show here that three-dimensional images with atomic resolution can be obtained by a direct transform of conventional LEED intensity spectra.",

keywords = "ELECTRON-DIFFRACTION, MULTIPLE-SCATTERING, HOLOGRAPHIC IMAGES, CRYSTALLOGRAPHY, PHOTOEMISSION, TRANSFORM, PATTERNS",

author = "P. Hu and DA KING and Peijun Hu",

year = "1992",

month = dec,

day = "17",

language = "English",

volume = "360",

pages = "655--658",

journal = "Nature",

issn = "0028-0836",

publisher = "Nature Research",

number = "6405",

}

TY - JOUR

T1 - A DIRECT INVERSION METHOD FOR SURFACE-STRUCTURE DETERMINATION FROM LEED INTENSITIES

AU - Hu, P.

AU - KING, DA

AU - Hu, Peijun

PY - 1992/12/17

Y1 - 1992/12/17

N2 - LOW-ENERGY electron diffraction (LEED) has become the most successful technique in surface crystallography1, but because of the complexity of the surface-electron scattering interactions, analyses of LEED data are still conducted on a trial-and-error basis: a direct-inversion method for treating LEED intensity data remains an attractive goal2. Building on recent theoretical and experimental developments in electron holography from surface structures3-16, we show here that three-dimensional images with atomic resolution can be obtained by a direct transform of conventional LEED intensity spectra.

AB - LOW-ENERGY electron diffraction (LEED) has become the most successful technique in surface crystallography1, but because of the complexity of the surface-electron scattering interactions, analyses of LEED data are still conducted on a trial-and-error basis: a direct-inversion method for treating LEED intensity data remains an attractive goal2. Building on recent theoretical and experimental developments in electron holography from surface structures3-16, we show here that three-dimensional images with atomic resolution can be obtained by a direct transform of conventional LEED intensity spectra.

KW - ELECTRON-DIFFRACTION

KW - MULTIPLE-SCATTERING

KW - HOLOGRAPHIC IMAGES

KW - CRYSTALLOGRAPHY

KW - PHOTOEMISSION

KW - TRANSFORM

KW - PATTERNS

M3 - Article

SN - 0028-0836

VL - 360

SP - 655

EP - 658

JO - Nature

JF - Nature

IS - 6405

ER -

A DIRECT INVERSION METHOD FOR SURFACE-STRUCTURE DETERMINATION FROM LEED INTENSITIES

Abstract

Keywords

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