A low overhead error confinement method based on application statistical characteristics

Zheng Wang, Georgios Karakonstantis, Anupam Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)


Reliability has emerged as a critical design constraint especially in memories. Designers are going to great lengths to guarantee fault free operation of the underlying silicon by adopting redundancy-based techniques, which essentially try to detect and correct every single error. However, such techniques come at a cost of large area, power and performance overheads which making many researchers to doubt their efficiency especially for error resilient systems where 100% accuracy is not always required. In this paper, we present an alternative method focusing on the confinement of the resulting output error induced by any reliability issues. By focusing on memory faults, rather than correcting every single error the proposed method exploits the statistical characteristics of any target application and replaces any erroneous data with the best available estimate of that data. To realize the proposed method a RISC processor is augmented with custom instructions and special-purpose functional units. We apply the method on the proposed enhanced processor by studying the statistical characteristics of the various algorithms involved in a popular multimedia application. Our experimental results show that in contrast to state-of-the-art fault tolerance approaches, we are able to reduce runtime and area overhead by 71.3% and 83.3% respectively.

Original languageEnglish
Title of host publicationProceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages4
ISBN (Electronic)978-3-9815-3707-9
ISBN (Print)9783981537062
Publication statusPublished - 28 Apr 2016
EventDesign Automation and Test in Europe, DATE - Dresden, Germany
Duration: 14 Mar 201618 Mar 2016


ConferenceDesign Automation and Test in Europe, DATE
Internet address

ASJC Scopus subject areas

  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality


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