A new device for the study of electron-ion interactions

Frederick Currell, John Aiken, Kenneth Dunn, X. Lu, Robert McCullough, E.J. Sokell, Brian O'Rourke, Vesselin Krastev, Hirofumi Watanabe

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)


The conceptual design of a new electron beam ion trap primarily intended for the study of electron-ion interactions is outlined along with some preliminary predictions regarding its capabilities. (C) 2003 Elsevier Science B.V. All rights reserved.
Original languageEnglish
Pages (from-to)230-233
Number of pages4
JournalNuclear Instruments & Methods in Physics Research - Section B: Beam Interactions with Materials and Atoms
Publication statusPublished - May 2003

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces


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