Abstract
In semiconductor fabrication processes, effective management of maintenance operations is fundamental to decrease costs associated with failures and downtime. Predictive Maintenance (PdM) approaches, based on statistical methods and historical data, are becoming popular for their predictive capabilities and low (potentially zero) added costs. We present here a PdM module based on Support Vector Machines for prediction of integral type faults, that is, the kind of failures that happen due to machine usage and stress of equipment parts. The proposed module may also be employed as a health factor indicator. The module has been applied to a frequent maintenance problem in semiconductor manufacturing industry, namely the breaking of the filament in the ion-source of ion-implantation tools. The PdM has been tested on a real production dataset.
Original language | English |
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Title of host publication | IEEE International Conference on Automation Science and Engineering |
Pages | 195-200 |
Number of pages | 6 |
DOIs | |
Publication status | Published - 01 Dec 2013 |
Event | 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013 - WI, Madison, United States Duration: 17 Aug 2013 → 20 Aug 2013 |
Conference
Conference | 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013 |
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Country/Territory | United States |
City | Madison |
Period | 17/08/2013 → 20/08/2013 |
Keywords
- Classification Methods
- Ion-Implantation
- Predictive Maintenance
- Semiconductor Manufacturing
- Support Vector Machines
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering