A technique for absolute measurements in near threshold excitation of positive ions: Application to excitation of C+

I. D. Williams*, J. B. Greenwood, B. Srigengan, R. W. O'Neill, I. G. Hughes

*Corresponding author for this work

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

An electron-ion crossed beams experiment has been developed in which the energy loss of scattered electrons is used to determine cross sections for excitation in positive ions. Scattered electrons are confined by an axial magnetic field and are channelled into a detector using reflecting potentials and an E × B (trochoidal) deflection. Complete collection of these electrons along with monitoring of the overlap and current of the beams enables absolute total cross sections to be determined. This technique has been used to study near threshold excitation of the 2P-2D resonance transition in C+.

Original languageEnglish
Pages (from-to)930-938
Number of pages9
JournalMeasurement Science and Technology
Volume9
Issue number6
DOIs
Publication statusPublished - 01 Jan 1998
Externally publishedYes

Keywords

  • CII
  • Electron-ion
  • Excitation
  • Near-threshold
  • Scattering
  • Trochoidal spectrometer

ASJC Scopus subject areas

  • Instrumentation
  • Applied Mathematics

Fingerprint Dive into the research topics of 'A technique for absolute measurements in near threshold excitation of positive ions: Application to excitation of C+'. Together they form a unique fingerprint.

Cite this