The split cylinder resonator method is improved for nondestructive and accurate measurement for low permittivity materials at multiple frequency points. The dielectric constants of flat substrate materials are calculated based on a rigorous mode match analysis of the TE/sub 011/ mode. The loss tangent is also approximately calculated. The dielectric properties of two commercial substrates have been measured at multiple frequencies. The results demonstrate that this technology is capable of accurately characterizing the dielectric properties of flat substrate materials versus frequency in a nondestructive way.
|Number of pages||6|
|Journal||IEEE Transactions on Instrumentation and Measurement|
|Publication status||Published - Dec 2004|
ASJC Scopus subject areas
- Electrical and Electronic Engineering