TY - CHAP
T1 - Acceleration of ions up to 20MeV/nucleon in the ultrashort, high-intensity regime
AU - Prasad, R.
AU - Ter-Avetisyan, S.
AU - Doria, D.
AU - Quinn, K.E.
AU - Romagnani, L.
AU - Zepf, M.
AU - Borghesi, M.
AU - Andreev, A.
AU - Foster, P.S.
AU - Brenner, C.M.
AU - Gallegos, P.
AU - Neely, D.
AU - Green, J.S.
AU - Streeter, M.J.V.
AU - Carroll, D.C.
AU - Tresca, O.
AU - McKenna, P.
AU - Dover, N.P.
AU - Palmer, C.A.J.
AU - Schreiber, J.
AU - Najmudin, Z.
PY - 2012/1/1
Y1 - 2012/1/1
N2 - The measurements reported here provide scaling laws for the ion acceleration process in the regime of ultrashort (50 fs), ultrahigh contrast (10) and ultrahigh intensity (> 10W/cm ), never investigated previously. The scaling of the accelerated ion energies was studied by varying a number of parameters such as target thickness (down to 10nm), target material (C and Al) and laser light polar- ization (circular and linear) at 35° and normal laser incidence. A twofold increase in proton energy and an order of magnitude enhancement in ion flux have been observed over the investigated thickness range at 35° angle of incidence. Further- more, at normal laser incidence, measured peak proton energies of about 20 MeV are observed almost independently of the target thickness over a wide range (50nm- 10 µm). 1.
AB - The measurements reported here provide scaling laws for the ion acceleration process in the regime of ultrashort (50 fs), ultrahigh contrast (10) and ultrahigh intensity (> 10W/cm ), never investigated previously. The scaling of the accelerated ion energies was studied by varying a number of parameters such as target thickness (down to 10nm), target material (C and Al) and laser light polar- ization (circular and linear) at 35° and normal laser incidence. A twofold increase in proton energy and an order of magnitude enhancement in ion flux have been observed over the investigated thickness range at 35° angle of incidence. Further- more, at normal laser incidence, measured peak proton energies of about 20 MeV are observed almost independently of the target thickness over a wide range (50nm- 10 µm). 1.
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84884840176&partnerID=8YFLogxK
U2 - 10.3254/978-1-61499-129-8-213
DO - 10.3254/978-1-61499-129-8-213
M3 - Chapter
AN - SCOPUS:84884840176
SN - 9781614991281
VL - 179
SP - 213
EP - 220
BT - Proceedings of the International School of Physics "Enrico Fermi"
ER -