Activities at the Tokyo EBIT 2010

N. Nakamura; Frederick Currell; Mingxing Hu; D. Kato; A. Komatsu; Y. Li; I. Murakami; H. Ohashi; S. Ohtani; H.A. Sakaue; M. Sakurai; M. Tona; X.M. Tong; H. Watanabe; T. Watanabe; T. Watanabe; C. Yamada; N. Yamamoto; A. Yamazaki

doi:10.1088/1748-0221/5/08/C08007

Activities at the Tokyo EBIT 2010

N. Nakamura, Frederick Currell, Mingxing Hu, D. Kato, A. Komatsu, Y. Li, I. Murakami, H. Ohashi, S. Ohtani, H.A. Sakaue, M. Sakurai, M. Tona, X.M. Tong, H. Watanabe, T. Watanabe, T. Watanabe, C. Yamada, N. Yamamoto, A. Yamazaki

Research output: Contribution to conference › Paper

1 Citation (Scopus)

Original language	English
Pages	0-0
Number of pages	1
DOIs	https://doi.org/10.1088/1748-0221/5/08/C08007
Publication status	Published - Aug 2010
Event	International Symposium on Electron Beam Ion Sources and Traps - Stockholm, Sweden Duration: 01 Aug 2010 → 01 Aug 2010

Conference

Conference	International Symposium on Electron Beam Ion Sources and Traps
Country/Territory	Sweden
City	Stockholm
Period	01/08/2010 → 01/08/2010

Access to Document

10.1088/1748-0221/5/08/C08007

Cite this

Nakamura, N., Currell, F., Hu, M., Kato, D., Komatsu, A., Li, Y., Murakami, I., Ohashi, H., Ohtani, S., Sakaue, H. A., Sakurai, M., Tona, M., Tong, X. M., Watanabe, H., Watanabe, T., Watanabe, T., Yamada, C., Yamamoto, N., & Yamazaki, A. (2010). Activities at the Tokyo EBIT 2010. 0-0. Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden. https://doi.org/10.1088/1748-0221/5/08/C08007

Nakamura, N. ; Currell, Frederick ; Hu, Mingxing ; Kato, D. ; Komatsu, A. ; Li, Y. ; Murakami, I. ; Ohashi, H. ; Ohtani, S. ; Sakaue, H.A. ; Sakurai, M. ; Tona, M. ; Tong, X.M. ; Watanabe, H. ; Watanabe, T. ; Watanabe, T. ; Yamada, C. ; Yamamoto, N. ; Yamazaki, A. / Activities at the Tokyo EBIT 2010. Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden.1 p.

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author = "N. Nakamura and Frederick Currell and Mingxing Hu and D. Kato and A. Komatsu and Y. Li and I. Murakami and H. Ohashi and S. Ohtani and H.A. Sakaue and M. Sakurai and M. Tona and X.M. Tong and H. Watanabe and T. Watanabe and T. Watanabe and C. Yamada and N. Yamamoto and A. Yamazaki",

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doi = "10.1088/1748-0221/5/08/C08007",

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note = "International Symposium on Electron Beam Ion Sources and Traps ; Conference date: 01-08-2010 Through 01-08-2010",

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Nakamura, N, Currell, F, Hu, M, Kato, D, Komatsu, A, Li, Y, Murakami, I, Ohashi, H, Ohtani, S, Sakaue, HA, Sakurai, M, Tona, M, Tong, XM, Watanabe, H, Watanabe, T, Watanabe, T, Yamada, C, Yamamoto, N & Yamazaki, A 2010, 'Activities at the Tokyo EBIT 2010', Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden, 01/08/2010 - 01/08/2010 pp. 0-0. https://doi.org/10.1088/1748-0221/5/08/C08007

Activities at the Tokyo EBIT 2010. / Nakamura, N.; Currell, Frederick; Hu, Mingxing; Kato, D.; Komatsu, A.; Li, Y.; Murakami, I.; Ohashi, H.; Ohtani, S.; Sakaue, H.A.; Sakurai, M.; Tona, M.; Tong, X.M.; Watanabe, H.; Watanabe, T.; Watanabe, T.; Yamada, C.; Yamamoto, N.; Yamazaki, A.

2010. 0-0 Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Activities at the Tokyo EBIT 2010

AU - Nakamura, N.

AU - Currell, Frederick

AU - Hu, Mingxing

AU - Kato, D.

AU - Komatsu, A.

AU - Li, Y.

AU - Murakami, I.

AU - Ohashi, H.

AU - Ohtani, S.

AU - Sakaue, H.A.

AU - Sakurai, M.

AU - Tona, M.

AU - Tong, X.M.

AU - Watanabe, H.

AU - Watanabe, T.

AU - Yamada, C.

AU - Yamamoto, N.

AU - Yamazaki, A.

PY - 2010/8

Y1 - 2010/8

U2 - 10.1088/1748-0221/5/08/C08007

DO - 10.1088/1748-0221/5/08/C08007

M3 - Paper

SP - 0

EP - 0

T2 - International Symposium on Electron Beam Ion Sources and Traps

Y2 - 1 August 2010 through 1 August 2010

ER -