Activities at the Tokyo EBIT 2010

N. Nakamura, Frederick Currell, Mingxing Hu, D. Kato, A. Komatsu, Y. Li, I. Murakami, H. Ohashi, S. Ohtani, H.A. Sakaue, M. Sakurai, M. Tona, X.M. Tong, H. Watanabe, T. Watanabe, T. Watanabe, C. Yamada, N. Yamamoto, A. Yamazaki

Research output: Contribution to conferencePaper

Original languageEnglish
Pages0-0
Number of pages1
DOIs
Publication statusPublished - Aug 2010
EventInternational Symposium on Electron Beam Ion Sources and Traps - Stockholm, Sweden
Duration: 01 Aug 201001 Aug 2010

Conference

ConferenceInternational Symposium on Electron Beam Ion Sources and Traps
CountrySweden
CityStockholm
Period01/08/201001/08/2010

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