Activities at the Tokyo EBIT 2010

N. Nakamura, Frederick Currell, Mingxing Hu, D. Kato, A. Komatsu, Y. Li, I. Murakami, H. Ohashi, S. Ohtani, H.A. Sakaue, M. Sakurai, M. Tona, X.M. Tong, H. Watanabe, T. Watanabe, T. Watanabe, C. Yamada, N. Yamamoto, A. Yamazaki

Research output: Contribution to conferencePaper

Original languageEnglish
Pages0-0
Number of pages1
DOIs
Publication statusPublished - Aug 2010
EventInternational Symposium on Electron Beam Ion Sources and Traps - Stockholm, Sweden
Duration: 01 Aug 201001 Aug 2010

Conference

ConferenceInternational Symposium on Electron Beam Ion Sources and Traps
CountrySweden
CityStockholm
Period01/08/201001/08/2010

Cite this

Nakamura, N., Currell, F., Hu, M., Kato, D., Komatsu, A., Li, Y., ... Yamazaki, A. (2010). Activities at the Tokyo EBIT 2010. 0-0. Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden. https://doi.org/10.1088/1748-0221/5/08/C08007
Nakamura, N. ; Currell, Frederick ; Hu, Mingxing ; Kato, D. ; Komatsu, A. ; Li, Y. ; Murakami, I. ; Ohashi, H. ; Ohtani, S. ; Sakaue, H.A. ; Sakurai, M. ; Tona, M. ; Tong, X.M. ; Watanabe, H. ; Watanabe, T. ; Watanabe, T. ; Yamada, C. ; Yamamoto, N. ; Yamazaki, A. / Activities at the Tokyo EBIT 2010. Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden.1 p.
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author = "N. Nakamura and Frederick Currell and Mingxing Hu and D. Kato and A. Komatsu and Y. Li and I. Murakami and H. Ohashi and S. Ohtani and H.A. Sakaue and M. Sakurai and M. Tona and X.M. Tong and H. Watanabe and T. Watanabe and T. Watanabe and C. Yamada and N. Yamamoto and A. Yamazaki",
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note = "International Symposium on Electron Beam Ion Sources and Traps ; Conference date: 01-08-2010 Through 01-08-2010",

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Nakamura, N, Currell, F, Hu, M, Kato, D, Komatsu, A, Li, Y, Murakami, I, Ohashi, H, Ohtani, S, Sakaue, HA, Sakurai, M, Tona, M, Tong, XM, Watanabe, H, Watanabe, T, Watanabe, T, Yamada, C, Yamamoto, N & Yamazaki, A 2010, 'Activities at the Tokyo EBIT 2010', Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden, 01/08/2010 - 01/08/2010 pp. 0-0. https://doi.org/10.1088/1748-0221/5/08/C08007

Activities at the Tokyo EBIT 2010. / Nakamura, N.; Currell, Frederick; Hu, Mingxing; Kato, D.; Komatsu, A.; Li, Y.; Murakami, I.; Ohashi, H.; Ohtani, S.; Sakaue, H.A.; Sakurai, M.; Tona, M.; Tong, X.M.; Watanabe, H.; Watanabe, T.; Watanabe, T.; Yamada, C.; Yamamoto, N.; Yamazaki, A.

2010. 0-0 Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Activities at the Tokyo EBIT 2010

AU - Nakamura, N.

AU - Currell, Frederick

AU - Hu, Mingxing

AU - Kato, D.

AU - Komatsu, A.

AU - Li, Y.

AU - Murakami, I.

AU - Ohashi, H.

AU - Ohtani, S.

AU - Sakaue, H.A.

AU - Sakurai, M.

AU - Tona, M.

AU - Tong, X.M.

AU - Watanabe, H.

AU - Watanabe, T.

AU - Watanabe, T.

AU - Yamada, C.

AU - Yamamoto, N.

AU - Yamazaki, A.

PY - 2010/8

Y1 - 2010/8

U2 - 10.1088/1748-0221/5/08/C08007

DO - 10.1088/1748-0221/5/08/C08007

M3 - Paper

SP - 0

EP - 0

ER -

Nakamura N, Currell F, Hu M, Kato D, Komatsu A, Li Y et al. Activities at the Tokyo EBIT 2010. 2010. Paper presented at International Symposium on Electron Beam Ion Sources and Traps, Stockholm, Sweden. https://doi.org/10.1088/1748-0221/5/08/C08007