Abstract
BiFeO3 thin films have been deposited on (111) SrTiO3 single crystal substrates by reactive molecular-beam epitaxy in an adsorption-controlled growth regime. This is achieved by supplying a bismuth overpressure and utilizing the differential vapor pressures between bismuth oxides and BiFeO3 to control stoichiometry. Four-circle x-ray diffraction reveals phase-pure, untwinned, epitaxial, (0001)-oriented films with rocking curve full width at half maximum values as narrow as 25 arc sec (0.007 degrees). Second harmonic generation polar plots combined with diffraction establish the crystallographic point group of these untwinned epitaxial films to be 3m at room temperature. (C) 2007 American Institute of Physics.
| Original language | English |
|---|---|
| Article number | 071922 |
| Pages (from-to) | - |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 91 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 13 Aug 2007 |
Fingerprint
Dive into the research topics of 'Adsorption-controlled molecular-beam epitaxial growth of BiFeO3'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver