An electron ion coincidence spectrometer for single and double photoionization studies

Thomas A. Field*, John H D Eland

*Corresponding author for this work

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

A new electron ion coincidence spectrometer for the study of single and double photoionization in the gas phase is described. The spectrometer employs a pulse scheme, which allows high mass and electron energy resolutions to be achieved simultaneously; the mass resolution is greater than 200 (M / ΔM, FWHM definition) and the electron energy resolutions are 55 meV and 300 meV for studying single and double photoionization respectively. A position-sensitive electron detector enables multiplex electron detection which significantly enhances the sensitivity of the instrument.

Original languageEnglish
Pages (from-to)922-929
Number of pages8
JournalMeasurement Science and Technology
Volume9
Issue number6
DOIs
Publication statusPublished - 1998
Externally publishedYes

Keywords

  • Coincidence techniques
  • Doubly charged ions
  • Ion spectroscopy
  • Photoionization
  • Singly charged ions

ASJC Scopus subject areas

  • Polymers and Plastics
  • Ceramics and Composites
  • Materials Science (miscellaneous)

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