Abstract
A new electron ion coincidence spectrometer for the study of single and double photoionization in the gas phase is described. The spectrometer employs a pulse scheme, which allows high mass and electron energy resolutions to be achieved simultaneously; the mass resolution is greater than 200 (M / ΔM, FWHM definition) and the electron energy resolutions are 55 meV and 300 meV for studying single and double photoionization respectively. A position-sensitive electron detector enables multiplex electron detection which significantly enhances the sensitivity of the instrument.
Original language | English |
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Pages (from-to) | 922-929 |
Number of pages | 8 |
Journal | Measurement Science and Technology |
Volume | 9 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1998 |
Externally published | Yes |
Keywords
- Coincidence techniques
- Doubly charged ions
- Ion spectroscopy
- Photoionization
- Singly charged ions
ASJC Scopus subject areas
- Polymers and Plastics
- Ceramics and Composites
- Materials Science (miscellaneous)