Analysis of nanometer–sized precipitates using atom probe techniques

A. Cerezo, C.R.M. Grovenor, M.G. Hetherington, Wei Sha, B.A. Shollock, G.D.W. Smith

    Research output: Contribution to journalArticle

    15 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)143-156
    Number of pages14
    JournalMaterials Characterization
    Volume25
    Publication statusPublished - 1990

    Cite this

    Cerezo, A., Grovenor, C. R. M., Hetherington, M. G., Sha, W., Shollock, B. A., & Smith, G. D. W. (1990). Analysis of nanometer–sized precipitates using atom probe techniques. Materials Characterization, 25, 143-156.