Atomic partial wave meter by attosecond coincidence metrology

Wenyu Jiang, Gregory S. J. Armstrong, Jihong Tong, Yidan Xu, Zitan Zuo, Junjie Qiang, Peifen Lu, Daniel D. A. Clarke, Jakub Benda, Avner Fleischer, Hongchen Ni, Kiyoshi Ueda, Hugo W. van Der Hart, Andrew C Brown^*, Xiaochun Gong^*, Jian Wu^*

^*Corresponding author for this work