Back gate effects in N-channel monocrystalline silicon devices-on-glass and their suppression by boron ion implantation

Paul Baine; Neil Mitchell; Harold Gamble; Mervyn Armstrong

Back gate effects in N-channel monocrystalline silicon devices-on-glass and their suppression by boron ion implantation

Paul Baine, Neil Mitchell, Harold Gamble, Mervyn Armstrong

Research output: Contribution to conference › Paper

Original language	English
Pages	369-374
Number of pages	6
Publication status	Published - Apr 1999
Event	Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held at the 1999 MRS Spring Meeting - San Francisco, United States Duration: 01 Apr 2000 → 01 Apr 2000

Conference

Conference	Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held at the 1999 MRS Spring Meeting
Country	United States
City	San Francisco
Period	01/04/2000 → 01/04/2000

Cite this

Baine, P., Mitchell, N., Gamble, H., & Armstrong, M. (1999). Back gate effects in N-channel monocrystalline silicon devices-on-glass and their suppression by boron ion implantation. 369-374. Paper presented at Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held at the 1999 MRS Spring Meeting, San Francisco, United States.

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title = "Back gate effects in N-channel monocrystalline silicon devices-on-glass and their suppression by boron ion implantation",

author = "Paul Baine and Neil Mitchell and Harold Gamble and Mervyn Armstrong",

year = "1999",

month = apr,

language = "English",

pages = "369--374",

note = "Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held at the 1999 MRS Spring Meeting ; Conference date: 01-04-2000 Through 01-04-2000",

}

Baine, P, Mitchell, N, Gamble, H & Armstrong, M 1999, 'Back gate effects in N-channel monocrystalline silicon devices-on-glass and their suppression by boron ion implantation', Paper presented at Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held at the 1999 MRS Spring Meeting, San Francisco, United States, 01/04/2000 - 01/04/2000 pp. 369-374.

Back gate effects in N-channel monocrystalline silicon devices-on-glass and their suppression by boron ion implantation. / Baine, Paul; Mitchell, Neil; Gamble, Harold; Armstrong, Mervyn.

1999. 369-374 Paper presented at Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held at the 1999 MRS Spring Meeting, San Francisco, United States.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Back gate effects in N-channel monocrystalline silicon devices-on-glass and their suppression by boron ion implantation

AU - Baine, Paul

AU - Mitchell, Neil

AU - Gamble, Harold

AU - Armstrong, Mervyn

PY - 1999/4

Y1 - 1999/4

M3 - Paper

SP - 369

EP - 374

T2 - Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held at the 1999 MRS Spring Meeting

Y2 - 1 April 2000 through 1 April 2000

ER -