Benchmarking segmentation results using a Markov model and a Bayes information criterion

Fionn Murtagh, Xiaoyu Qiao, Daniel Crookes, Paul Walsh, Muhammed Basheer, A Long

Research output: Contribution to conference › Paper

Original language	English
Pages	248-254
Number of pages	7
Publication status	Published - Sept 2003
Event	Conference on Optical Metrology, Imaging, and Machine Vision - Galway, Ireland Duration: 01 Sept 2003 → 01 Sept 2003

Conference	Conference on Optical Metrology, Imaging, and Machine Vision
Country/Territory	Ireland
City	Galway
Period	01/09/2003 → 01/09/2003

Cite this

@conference{60db0cb550004b3ca3a6ddd18c200236,

title = "Benchmarking segmentation results using a Markov model and a Bayes information criterion",

author = "Fionn Murtagh and Xiaoyu Qiao and Daniel Crookes and Paul Walsh and Muhammed Basheer and A Long",

year = "2003",

month = sep,

language = "English",

pages = "248--254",

note = "Conference on Optical Metrology, Imaging, and Machine Vision ; Conference date: 01-09-2003 Through 01-09-2003",

}

TY - CONF

T1 - Benchmarking segmentation results using a Markov model and a Bayes information criterion

AU - Murtagh, Fionn

AU - Qiao, Xiaoyu

AU - Crookes, Daniel

AU - Walsh, Paul

AU - Basheer, Muhammed

AU - Long, A

PY - 2003/9

Y1 - 2003/9

M3 - Paper

SP - 248

EP - 254

T2 - Conference on Optical Metrology, Imaging, and Machine Vision

Y2 - 1 September 2003 through 1 September 2003

ER -