Building and validating a reduced TPC-H benchmark

Hans Vandierendonck, P. Trancoso

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
Original languageEnglish
Title of host publication14th IEEE International Symposium on Modeling, Analysis, and Simulation
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages383-392
ISBN (Print)0-7695-2573-3
DOIs
Publication statusPublished - 11 Sept 2006

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