Capture and loss of electron by MeV ions penetrating through liquid spray: Formation of negative ion and neutral atom beams

S. Ter-Avetisyan, M. Borghesi, M. Schnurer, J. Branzel, S. Jequier, V. Tikhonchuk

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Charge changing processes of MeV ions penetrating through liquid spray is confirmed to be abundant source of various energetic negative ion and neutral atom beams its generic nature is demonstrated.

Original languageEnglish
Title of host publication2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume4
ISBN (Print)9781467371094
DOIs
Publication statusPublished - 11 Jan 2016
Event11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 - Busan, Korea, Republic of
Duration: 24 Aug 201528 Aug 2015

Conference

Conference11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
CountryKorea, Republic of
CityBusan
Period24/08/201528/08/2015

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Capture and loss of electron by MeV ions penetrating through liquid spray: Formation of negative ion and neutral atom beams'. Together they form a unique fingerprint.

  • Cite this

    Ter-Avetisyan, S., Borghesi, M., Schnurer, M., Branzel, J., Jequier, S., & Tikhonchuk, V. (2016). Capture and loss of electron by MeV ions penetrating through liquid spray: Formation of negative ion and neutral atom beams. In 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 (Vol. 4). [7376319] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2015.7376319