Changes in functional behavior of 93 % Pb(Mg1/3Nb2/3)O-3-7 % PbTiO3 thin films induced by ac electric fields

N.J. Donnelly, Robert Bowman, Marty Gregg

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The dielectric properties of Au/[93%Pb(Mg1/3Nb2/3)O-3-7%PbTiO3] (PMN-PT)/(La0.5Sr0.5)CoO3/MgO thin-film capacitor heterostructures, made using pulsed laser deposition, have been investigated, with particular emphasis on the changes in response associated with increasing the magnitude of the ac measuring field. It was found that increasing the ac field caused a change in the frequency spectrum of relaxators, increasing the speed of response of "slow" relaxators, with an associated decrease in the freezing temperature (T-f) of the relaxor system; in addition, other characteristic parameters relating to polar relaxation (activation energy E-a and attempt frequency 1/tau(0)), described by fitting of the dielectric response to a Vogel-Fulcher expression, were found to change continuously as ac field levels were increased.
Original languageEnglish
Article number064110
Pages (from-to)064110-064110
Number of pages1
JournalPhysical Review B (Condensed Matter)
Volume73
Issue number6
DOIs
Publication statusPublished - Feb 2006

ASJC Scopus subject areas

  • Condensed Matter Physics

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