Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm

J. Zhang, P.J. Warwick, E. Wolfrum, M.H. Key, C. Danson, A. Demir, S. Healy, D. Kalantar, N.S. Kim, Ciaran Lewis, J. Lin, A. MacPhee, D. Neely, J. Nilsen, G.J. Pert, R. Smith, G.J. Tallents, J.S. Wark

Research output: Contribution to conferencePaper

3 Citations (Scopus)
Original languageEnglish
Pages56-58
Number of pages3
Publication statusPublished - Jun 1996
Event5th International Conference on X-ray Lasers - Lund, Sweden
Duration: 01 Jun 199601 Jun 1996

Conference

Conference5th International Conference on X-ray Lasers
CountrySweden
CityLund
Period01/06/199601/06/1996

Cite this

Zhang, J., Warwick, P. J., Wolfrum, E., Key, M. H., Danson, C., Demir, A., Healy, S., Kalantar, D., Kim, N. S., Lewis, C., Lin, J., MacPhee, A., Neely, D., Nilsen, J., Pert, G. J., Smith, R., Tallents, G. J., & Wark, J. S. (1996). Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm. 56-58. Paper presented at 5th International Conference on X-ray Lasers, Lund, Sweden.