Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography

J.A. King; K. Akli; R.A. Snavely; B. Zhang; M.H. Key; C.D. Chen; M. Chen; S.P. Hatchett; J.A. Koch; A.J. MacKinnon; P.K. Patel; T. Phillips; R.P.J. Town; R.R. Freeman; Marco Borghesi; Lorenzo Romagnani; Matthew Zepf; T. Cowan; R. Stephens; K.L. Lancaster; C.D. Murphy; P. Norreys; C. Stoeckl

doi:10.1063/1.1940091

Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography

J.A. King, K. Akli, R.A. Snavely, B. Zhang, M.H. Key, C.D. Chen, M. Chen, S.P. Hatchett, J.A. Koch, A.J. MacKinnon, P.K. Patel, T. Phillips, R.P.J. Town, R.R. Freeman, Marco Borghesi, Lorenzo Romagnani, Matthew Zepf, T. Cowan, R. Stephens, K.L. LancasterC.D. Murphy, P. Norreys, C. Stoeckl

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

K alpha radiation generated by interaction of an ultrashort (1 ps) laser with thin (25 mu m) Ti foils at high intensity (2x10(16) W/cm(2)) is analyzed using data from a spherical Bragg crystal imager and a single hit charge-coupled device spectrometer together with Monte Carlo simulations of K alpha brightness. Laser to K alpha and electron conversion efficiencies have been determined. We have also measured an effective crystal reflectivity of 3.75 +/- 2%. Comparison of imager data with data from the relatively broadband single hit spectrometer has revealed a reduction in crystal collection efficiency for high K alpha yield. This is attributed to a shift in the K-shell spectrum due to Ti ionization. (c) 2005 American Institute of Physics.

Original language	English
Article number	076102
Pages (from-to)	076102
Number of pages	1
Journal	Review of Scientific Instruments
Volume	76
Issue number	7
DOIs	https://doi.org/10.1063/1.1940091
Publication status	Published - Jul 2005

ASJC Scopus subject areas

Instrumentation
Physics and Astronomy (miscellaneous)

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10.1063/1.1940091

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King, J. A., Akli, K., Snavely, R. A., Zhang, B., Key, M. H., Chen, C. D., Chen, M., Hatchett, S. P., Koch, J. A., MacKinnon, A. J., Patel, P. K., Phillips, T., Town, R. P. J., Freeman, R. R., Borghesi, M., Romagnani, L., Zepf, M., Cowan, T., Stephens, R., ... Stoeckl, C. (2005). Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography. Review of Scientific Instruments, 76(7), 076102. [076102]. https://doi.org/10.1063/1.1940091

King, J.A. ; Akli, K. ; Snavely, R.A. ; Zhang, B. ; Key, M.H. ; Chen, C.D. ; Chen, M. ; Hatchett, S.P. ; Koch, J.A. ; MacKinnon, A.J. ; Patel, P.K. ; Phillips, T. ; Town, R.P.J. ; Freeman, R.R. ; Borghesi, Marco ; Romagnani, Lorenzo ; Zepf, Matthew ; Cowan, T. ; Stephens, R. ; Lancaster, K.L. ; Murphy, C.D. ; Norreys, P. ; Stoeckl, C. / Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography. In: Review of Scientific Instruments. 2005 ; Vol. 76, No. 7. pp. 076102.

@article{1d8be9c17f254e22bfe66d440859349b,

title = "Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography",

abstract = "K alpha radiation generated by interaction of an ultrashort (1 ps) laser with thin (25 mu m) Ti foils at high intensity (2x10(16) W/cm(2)) is analyzed using data from a spherical Bragg crystal imager and a single hit charge-coupled device spectrometer together with Monte Carlo simulations of K alpha brightness. Laser to K alpha and electron conversion efficiencies have been determined. We have also measured an effective crystal reflectivity of 3.75 +/- 2%. Comparison of imager data with data from the relatively broadband single hit spectrometer has revealed a reduction in crystal collection efficiency for high K alpha yield. This is attributed to a shift in the K-shell spectrum due to Ti ionization. (c) 2005 American Institute of Physics.",

author = "J.A. King and K. Akli and R.A. Snavely and B. Zhang and M.H. Key and C.D. Chen and M. Chen and S.P. Hatchett and J.A. Koch and A.J. MacKinnon and P.K. Patel and T. Phillips and R.P.J. Town and R.R. Freeman and Marco Borghesi and Lorenzo Romagnani and Matthew Zepf and T. Cowan and R. Stephens and K.L. Lancaster and C.D. Murphy and P. Norreys and C. Stoeckl",

year = "2005",

month = jul,

doi = "10.1063/1.1940091",

language = "English",

volume = "76",

pages = "076102",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

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King, JA, Akli, K, Snavely, RA, Zhang, B, Key, MH, Chen, CD, Chen, M, Hatchett, SP, Koch, JA, MacKinnon, AJ, Patel, PK, Phillips, T, Town, RPJ, Freeman, RR, Borghesi, M, Romagnani, L, Zepf, M, Cowan, T, Stephens, R, Lancaster, KL, Murphy, CD, Norreys, P & Stoeckl, C 2005, 'Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography', Review of Scientific Instruments, vol. 76, no. 7, 076102, pp. 076102. https://doi.org/10.1063/1.1940091

Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography. / King, J.A.; Akli, K.; Snavely, R.A.; Zhang, B.; Key, M.H.; Chen, C.D.; Chen, M.; Hatchett, S.P.; Koch, J.A.; MacKinnon, A.J.; Patel, P.K.; Phillips, T.; Town, R.P.J.; Freeman, R.R.; Borghesi, Marco; Romagnani, Lorenzo; Zepf, Matthew; Cowan, T.; Stephens, R.; Lancaster, K.L.; Murphy, C.D.; Norreys, P.; Stoeckl, C.

In: Review of Scientific Instruments, Vol. 76, No. 7, 076102, 07.2005, p. 076102.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography

AU - King, J.A.

AU - Akli, K.

AU - Snavely, R.A.

AU - Zhang, B.

AU - Key, M.H.

AU - Chen, C.D.

AU - Chen, M.

AU - Hatchett, S.P.

AU - Koch, J.A.

AU - MacKinnon, A.J.

AU - Patel, P.K.

AU - Phillips, T.

AU - Town, R.P.J.

AU - Freeman, R.R.

AU - Borghesi, Marco

AU - Romagnani, Lorenzo

AU - Zepf, Matthew

AU - Cowan, T.

AU - Stephens, R.

AU - Lancaster, K.L.

AU - Murphy, C.D.

AU - Norreys, P.

AU - Stoeckl, C.

PY - 2005/7

Y1 - 2005/7

N2 - K alpha radiation generated by interaction of an ultrashort (1 ps) laser with thin (25 mu m) Ti foils at high intensity (2x10(16) W/cm(2)) is analyzed using data from a spherical Bragg crystal imager and a single hit charge-coupled device spectrometer together with Monte Carlo simulations of K alpha brightness. Laser to K alpha and electron conversion efficiencies have been determined. We have also measured an effective crystal reflectivity of 3.75 +/- 2%. Comparison of imager data with data from the relatively broadband single hit spectrometer has revealed a reduction in crystal collection efficiency for high K alpha yield. This is attributed to a shift in the K-shell spectrum due to Ti ionization. (c) 2005 American Institute of Physics.

AB - K alpha radiation generated by interaction of an ultrashort (1 ps) laser with thin (25 mu m) Ti foils at high intensity (2x10(16) W/cm(2)) is analyzed using data from a spherical Bragg crystal imager and a single hit charge-coupled device spectrometer together with Monte Carlo simulations of K alpha brightness. Laser to K alpha and electron conversion efficiencies have been determined. We have also measured an effective crystal reflectivity of 3.75 +/- 2%. Comparison of imager data with data from the relatively broadband single hit spectrometer has revealed a reduction in crystal collection efficiency for high K alpha yield. This is attributed to a shift in the K-shell spectrum due to Ti ionization. (c) 2005 American Institute of Physics.

U2 - 10.1063/1.1940091

DO - 10.1063/1.1940091

M3 - Article

VL - 76

SP - 076102

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 7

M1 - 076102

ER -

Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography

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