Characterization of a picosecond laser generated 4.5 keV TiK-alpha source for pulsed radiography

J.A. King, K. Akli, R.A. Snavely, B. Zhang, M.H. Key, C.D. Chen, M. Chen, S.P. Hatchett, J.A. Koch, A.J. MacKinnon, P.K. Patel, T. Phillips, R.P.J. Town, R.R. Freeman, Marco Borghesi, Lorenzo Romagnani, Matthew Zepf, T. Cowan, R. Stephens, K.L. LancasterC.D. Murphy, P. Norreys, C. Stoeckl

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)

Abstract

K alpha radiation generated by interaction of an ultrashort (1 ps) laser with thin (25 mu m) Ti foils at high intensity (2x10(16) W/cm(2)) is analyzed using data from a spherical Bragg crystal imager and a single hit charge-coupled device spectrometer together with Monte Carlo simulations of K alpha brightness. Laser to K alpha and electron conversion efficiencies have been determined. We have also measured an effective crystal reflectivity of 3.75 +/- 2%. Comparison of imager data with data from the relatively broadband single hit spectrometer has revealed a reduction in crystal collection efficiency for high K alpha yield. This is attributed to a shift in the K-shell spectrum due to Ti ionization. (c) 2005 American Institute of Physics.
Original languageEnglish
Article number076102
Pages (from-to)076102
Number of pages1
JournalReview of Scientific Instruments
Volume76
Issue number7
DOIs
Publication statusPublished - Jul 2005

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

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