Characterization of x-ray lasers at short wavelengths

G.J. Tallents, J.Y. Lin, R. Smith, A.G. MacPhee, E. Wolfrum, J. Zhang, G. Eker, R. Keenan, Ciaran Lewis, D. Neely, R.M.N. O'Rourke, G.J. Pert, S.J. Pestehe, J.S. Wark

Research output: Contribution to conferencePaper

Original languageEnglish
Pages59-65
Number of pages7
Publication statusPublished - Aug 1999
Event6th International Conference on X-Ray Lasers - Kyoto, Japan
Duration: 01 Aug 199901 Aug 1999

Conference

Conference6th International Conference on X-Ray Lasers
CountryJapan
CityKyoto
Period01/08/199901/08/1999

Cite this

Tallents, G. J., Lin, J. Y., Smith, R., MacPhee, A. G., Wolfrum, E., Zhang, J., Eker, G., Keenan, R., Lewis, C., Neely, D., O'Rourke, R. M. N., Pert, G. J., Pestehe, S. J., & Wark, J. S. (1999). Characterization of x-ray lasers at short wavelengths. 59-65. Paper presented at 6th International Conference on X-Ray Lasers, Kyoto, Japan.