Classification through maximizing density (extended abstract)

Hui Wang, Ivo Duentsch, David Bell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationUnknown Host Publication
Place of PublicationUnited States
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages655-656
Number of pages2
Publication statusPublished - 2001

Bibliographical note

IEEE International Conference on Data Mining (ICDM) ; Conference date: 01-01-2001

Cite this