Abstract
A very fast method, cluster low-energy electron diffraction (LEED) is proposed for LEED I-V spectral analysis, in which three appproximations are introduced: the small-atom approximation, omission of the structure factors, and truncation of higher order ( > 2) scattering events. The method has been tested using a total of four sets of I-V spectra calculated by fully dynamic LEED for (i) the simple overlayer system, O on Ni{100}, and (ii) the reconstructed system, Cu on W{100}, and also one set of experimental data from W{100}-c(2 X 2)-Cu. In each case the correct structural parameters are recovered. It is suggested that for complex systems cluster LEED provides an efficient fast route to trial structures, which could be refined by automated tenser LEED.
| Original language | English |
|---|---|
| Pages (from-to) | 2791-2800 |
| Number of pages | 10 |
| Journal | Physical Review B (Condensed Matter) |
| Volume | 49 |
| Issue number | 4 |
| Publication status | Published - 15 Jan 1994 |
Keywords
- ENERGY ELECTRON-DIFFRACTION
- RAY PHOTOELECTRON-SPECTROSCOPY
- MULTIPLE-SCATTERING
- TENSOR LEED
- HOLOGRAPHIC IMAGES
- CRYSTALLOGRAPHY
- RANGE