COHERENCE AND DOUBLE-PASS AMPLIFICATION IN GE SOFT-X-RAY LASER

Y. Kato, M. Yamanaka, H. Daido, H. Shiraga, H. Azuma, K. Murai, G. Yuan, E. Miura, T. Kanabe, M. Takagi, S. Nakai, Ciaran Lewis, D.M. Oneill, D. Neely, M. Niibe, N. Tsukamoto, Y. Fukuda

Research output: Contribution to conferencePaper

Original languageEnglish
Publication statusPublished - May 1992
Event3RD INTERNATIONAL COLLOQUIUM ON X-RAY LASER - Schliersee, Germany
Duration: 01 May 199201 May 1992

Conference

Conference3RD INTERNATIONAL COLLOQUIUM ON X-RAY LASER
CountryGermany
CitySchliersee
Period01/05/199201/05/1992

Cite this

Kato, Y., Yamanaka, M., Daido, H., Shiraga, H., Azuma, H., Murai, K., Yuan, G., Miura, E., Kanabe, T., Takagi, M., Nakai, S., Lewis, C., Oneill, D. M., Neely, D., Niibe, M., Tsukamoto, N., & Fukuda, Y. (1992). COHERENCE AND DOUBLE-PASS AMPLIFICATION IN GE SOFT-X-RAY LASER. Paper presented at 3RD INTERNATIONAL COLLOQUIUM ON X-RAY LASER, Schliersee, Germany.