Comments on 'application of the interface capacitance model to thin film relaxors and ferroelectrics'

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@article{faa2fdaf0cd34a38aecf2eadfcf55e38,

title = "Comments on 'application of the interface capacitance model to thin film relaxors and ferroelectrics'",

author = "Marty Gregg",

year = "2006",

month = nov,

doi = "10.1063/1.2385627",

language = "English",

volume = "89",

pages = "196101--196101",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "19",

}

TY - JOUR

T1 - Comments on 'application of the interface capacitance model to thin film relaxors and ferroelectrics'

AU - Gregg, Marty

PY - 2006/11

Y1 - 2006/11

UR - http://www.scopus.com/inward/record.url?scp=33750925758&partnerID=8YFLogxK

U2 - 10.1063/1.2385627

DO - 10.1063/1.2385627

M3 - Article

VL - 89

SP - 196101

EP - 196101

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 19

M1 - 196101

ER -