Control of Leakage Current in Polysilicon TFT´s by the Implantation of Boron

L.J. Quinn, Paul Baine, Brian Lee, Neil Mitchell, Mervyn Armstrong, Harold Gamble

Research output: Contribution to conferencePaper

Original languageEnglish
Pages588-591
Number of pages4
Publication statusPublished - Sep 1998
EventESSDERC'98 - , United Kingdom
Duration: 01 Sep 1998 → …

Conference

ConferenceESSDERC'98
CountryUnited Kingdom
Period01/09/1998 → …

Cite this

Quinn, L. J., Baine, P., Lee, B., Mitchell, N., Armstrong, M., & Gamble, H. (1998). Control of Leakage Current in Polysilicon TFT´s by the Implantation of Boron. 588-591. Paper presented at ESSDERC'98, United Kingdom.