Current-induced forces in atomic-scale conductors

Tchavdar Todorov, J. Hoekstra, A.P. Sutton

Research output: Contribution to journalArticlepeer-review

83 Citations (Scopus)


We present a self-consistent tight-binding formalism to calculate the forces on individual atoms due to the flow of electrical current in atomic-scale conductors. Simultaneously with the forces, the method yields the local current density and the local potential in the presence of current flow, allowing a direct comparison between these quantities. The method is applicable to structures of arbitrary atomic geometry and can be used to model current-induced mechanical effects in realistic nanoscale junctions and wires. The formalism is implemented within a simple Is tight-binding model and is applied to two model structures; atomic chains and a nanoscale wire containing a vacancy.
Original languageEnglish
Pages (from-to)421-455
Number of pages35
JournalPhilosophical Magazine B-physics Of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties
Issue number3
Publication statusPublished - Mar 2000

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Physics and Astronomy(all)


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