Cybersecurity Test-Bed for IEC 61850 based Smart Substations

Y. Yang, H.T. Jiang, K. McLaughlin, L. Gao, Y.B. Yuan, W. Huang, S. Sezer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)
1799 Downloads (Pure)

Abstract

With the development and deployment of IEC 61850 based smart substations, cybersecurity vulnerabilities of supervisory control and data acquisition (SCADA) systems are increasingly emerging. In response to the emergence of cybersecurity vulnerabilities in smart substations, a test-bed is indispensable to enable cybersecurity experimentation. In this paper, a comprehensive and realistic cyber-physical test-bed has been built to investigate potential cybersecurity vulnerabilities and the impact of cyber-attacks on IEC 61850 based smart substations. This test-bed is close to a real production type environment, and has the ability to carry out end-to-end testing of cyber-attacks and physical consequences. A fuzz testing approach is proposed for detecting IEC 61850 based intelligent electronic devices (IEDs) and validated in the proposed test-bed.
Original languageEnglish
Title of host publicationProceedings of 2015 IEEE Power & Energy Society General Meeting
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-5
Number of pages5
ISBN (Print)978-1-4673-8040-9
DOIs
Publication statusPublished - Jul 2015
EventPowering Up The Next Generation: 2015 IEEE Power and Energy Society General Meeting - Colorado, Denver, United States
Duration: 26 Jul 201530 Jul 2015

Conference

ConferencePowering Up The Next Generation: 2015 IEEE Power and Energy Society General Meeting
CountryUnited States
CityDenver
Period26/07/201530/07/2015

Keywords

  • Smart Grid
  • Security
  • Cyberspace

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  • Cite this

    Yang, Y., Jiang, H. T., McLaughlin, K., Gao, L., Yuan, Y. B., Huang, W., & Sezer, S. (2015). Cybersecurity Test-Bed for IEC 61850 based Smart Substations. In Proceedings of 2015 IEEE Power & Energy Society General Meeting (pp. 1-5). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/PESGM.2015.7286357