DC resistance and dielectric function at 3392 nm of YBCO films from 300 K to 80 K

T Bade, C Rea, P Dawson, RM Bowman, DG Walmsley

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The dielectric function of a YBCO film was determined at 3392nm at temperatures down to 80K. Results obtained were epsilon(i) = -24.09 - 0.0013T and epsilon(i) = 7.66 + 0.067T. The results for epsilon(i) are compared with the de resistance of the film. Intrinsic intragrain scattering, elastic and inelastic grain boundary scattering and optical interband absorption are estimated as 82%, 5%, 13% and 10% respecively at 0K.

Original languageEnglish
Pages (from-to)1395-1396
Number of pages2
JournalCzechoslovak journal of physics
Publication statusPublished - 1996
Event21st International Conference on Low Temperature Physics (LT 21) - PRAGUE, Czech Republic
Duration: 08 Aug 199614 Aug 1996



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