Dependence of the interfacial capacitance on measurement regime used for investigation of thin film ferroelectric capacitors

L.J. Sinnamon, J. McAneney, Robert Bowman, Marty Gregg

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)
Original languageEnglish
Pages (from-to)736-744
Number of pages9
JournalJournal of Applied Physics
Volume93
Issue number1
DOIs
Publication statusPublished - 01 Jan 2003

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this