Design and validation of an automation strategy for the strip test process in the semiconductor industry

Muhamad Arfauz A. Rahman*, Chengsi Lin, Paul G. Maropoulos, Woei Sheng Teoh, Azrul Azwan Abdul Rahman, Effendi Mohamad

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering

Computer Science