Dielectric constant characterization using a numerical method for the microstrip ring resonator

X.Y. Fang, David Linton, C. Walker, B. Collins

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

A new method of dielectric-constant measurement is developed. The dielectric constant epsilon(r) RF/microwave substrate is extracted by combining the microstrip ring resonator measurement with Ansoft HFSS electromagnetic simulation software. The developed method has two advantages: (i) characterization of dielectric constant versus multiple frequency points, and (ii) compatibility with electronics design automation (EDA) software tools. This characterization method can reduce the design cycle of microwave circuits and devices. (C) 2004 Wiley Periodicals, Inc.
Original languageEnglish
Pages (from-to)14-17
Number of pages4
JournalMicrowave and Optical Technology Letters
Volume41
Issue number1
DOIs
Publication statusPublished - 05 Apr 2004

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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