Dielectronic recombination in highly charged He-like ions

Brian O'Rourke, Frederick Currell, H. Kuramoto, Y.M. Li, S. Ohtani, X.M. Tong, Hirofumi Watanabe

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

We have determined resonant strengths of the KLn (2 less than or equal to n less than or equal to 5) resonances for helium-like Ti ions and (3 less than or equal to n less than or equal to 5) resonances for helium-like Fe ions. The results were obtained using the Tokyo electron beam ion trap. Characteristic X-rays from both dielectronic recombination and radiative recombination were detected as the electron beam energy was scanned through the resonances. (C) 2003 Elsevier Science B.V. All rights reserved.
Original languageEnglish
Pages (from-to)378-381
Number of pages4
JournalNuclear Instruments & Methods in Physics Research - Section B: Beam Interactions with Materials and Atoms
Volume205
DOIs
Publication statusPublished - May 2003

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

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