Abstract
Decay dynamics of dielectronic recombination (DR) processes of H-like titanium ions was investigated with an electron beam ion trap. In the DR of H-like ions a K-shell vacancy is available even after the decay of the doubly excited state produced by the recombination. Therefore secondary X-ray emission is possible. An observed X-ray spectrum of DR obtained in the present experiment was well reproduced theoretically by taking into account the secondary X-rays. (c) 2005 Elsevier B.V. All rights reserved.
Original language | English |
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Pages (from-to) | 261-264 |
Number of pages | 4 |
Journal | Nuclear Instruments & Methods in Physics Research - Section B: Beam Interactions with Materials and Atoms |
Volume | 235 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - Jul 2005 |
ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Instrumentation
- Surfaces and Interfaces