Abstract
The present research exploits diffusion brazing of mechanically alloyed Y2O3 dispersion strengthened nickel-base MA760 and iron-base MA956 alloys using B-and P-containing thin foil and sputter coated interlayers. Microstructures of diffusion brazed interface before and after recrystallization annealing were investigated using optical metallography, electron microprobe analysis, and transmission electron microscopy. It has been found that B and P have a strong influence on the recrystallization behavior of these materials. Too high B or P levels in the interlayers caused recrystallization of the base alloys during brazing process which was operated at temperatures below normal recrystallization points.
| Original language | English |
|---|---|
| Pages (from-to) | 16-22 |
| Number of pages | 7 |
| Journal | Rare Metals |
| Volume | 15 |
| Issue number | 1 |
| Publication status | Published - 01 Jan 1996 |
ASJC Scopus subject areas
- Materials Science(all)
- Metals and Alloys