Direct measurements of compressive and tensile strain during shock breakout by use of sub-nanosecond X-ray diffraction

J.S. Wark, David Riley, N.C. Woolsey, G. Keihn, R.R. Whitlock

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@article{379d59bea4104b7da34d67eeaa9ddc50,

title = "Direct measurements of compressive and tensile strain during shock breakout by use of sub-nanosecond X-ray diffraction",

author = "J.S. Wark and David Riley and N.C. Woolsey and G. Keihn and R.R. Whitlock",

year = "1990",

doi = "10.1063/1.346158",

language = "English",

volume = "68(9)",

pages = "4531--4534",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Direct measurements of compressive and tensile strain during shock breakout by use of sub-nanosecond X-ray diffraction

AU - Wark, J.S.

AU - Riley, David

AU - Woolsey, N.C.

AU - Keihn, G.

AU - Whitlock, R.R.

PY - 1990

Y1 - 1990

U2 - 10.1063/1.346158

DO - 10.1063/1.346158

M3 - Article

VL - 68(9)

SP - 4531

EP - 4534

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

ER -