Dissociative electron attachment to C2F5 radicals

Sean A. Haughey, Thomas A. Field, Judith Langer, Nicholas S. Shuman, Thomas M. Miller, Jeffrey F. Friedman, A. A. Viggiano

Research output: Contribution to journalArticle

15 Citations (Scopus)
314 Downloads (Pure)

Abstract

Dissociative electron attachment to the reactive C2F5 molecular radical has been investigated with two complimentary experimental methods; a single collision beam experiment and a new flowing afterglow Langmuir probe technique. The beam results show that F- is formed close to zero electron energy in dissociative electron attachment to C2F5. The afterglow measurements also show that F- is formed in collisions between electrons and C2F5 molecules with rate constants of 3.7 × 10-9 cm3 s-1 to 4.7 × 10-9 cm3 s-1 at temperatures of 300–600 K. The rate constant increases slowly with increasing temperature, but the rise observed is smaller than the experimental uncertainty of 35%.
Original languageEnglish
Article number054310
Number of pages8
JournalJournal of Chemical Physics
Volume137
Issue number5
Early online date03 Aug 2012
DOIs
Publication statusPublished - 2012

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Fingerprint Dive into the research topics of 'Dissociative electron attachment to C2F5 radicals'. Together they form a unique fingerprint.

  • Cite this

    Haughey, S. A., Field, T. A., Langer, J., Shuman, N. S., Miller, T. M., Friedman, J. F., & Viggiano, A. A. (2012). Dissociative electron attachment to C2F5 radicals. Journal of Chemical Physics, 137(5), [054310]. https://doi.org/10.1063/1.4738759