Electrical and Optical Characterization of GeON Layers with High-ĸ Gate Stacks on Germanium for Future MOSFETs

Shahjahan Murad, Paul Baine, John Montgomery, David McNeill, Neil Mitchell, Mervyn Armstrong, Mircea Modreanu

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)137-144
Number of pages8
JournalECS Transactions
Issue number3
Publication statusPublished - Apr 2012

Cite this