Electrical Properties of High-k Ta O Gate Dielectrics on Strained Ge-Rich Layers

Research output: Contribution to conference › Paper

Original language	English
Pages	483-486
Number of pages	4
Publication status	Published - May 2004
Event	Intl Conf on Microelectronics (MIEL) (IEEE Cat. No.04TH8716) - Nis, Serbia Duration: 01 May 2004 → 01 May 2004

Conference	Intl Conf on Microelectronics (MIEL) (IEEE Cat. No.04TH8716)
Country/Territory	Serbia
City	Nis
Period	01/05/2004 → 01/05/2004

Cite this

@conference{ad73e359ac834b4a9619f3628ec6dbb9,

title = "Electrical Properties of High-k Ta O Gate Dielectrics on Strained Ge-Rich Layers",

author = "Mervyn Armstrong and Harold Gamble",

year = "2004",

month = may,

language = "English",

pages = "483--486",

note = "Intl Conf on Microelectronics (MIEL) (IEEE Cat. No.04TH8716) ; Conference date: 01-05-2004 Through 01-05-2004",

}