Electro-thermal theory of intermodulation distortion in lossy microwave components

J.R. Wilkerson, K.G. Gard, Alexander Schuchinsky, M.B. Steer

Research output: Contribution to journalArticlepeer-review

86 Citations (Scopus)
5 Downloads (Pure)

Abstract

An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz.
Original languageEnglish
Article number4682670
Pages (from-to)2717-2725
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume56
Issue number12
DOIs
Publication statusPublished - Dec 2008

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Radiation

Fingerprint

Dive into the research topics of 'Electro-thermal theory of intermodulation distortion in lossy microwave components'. Together they form a unique fingerprint.

Cite this