Electro-thermal theory of intermodulation distortion in lossy microwave components

J.R. Wilkerson, K.G. Gard, Alexander Schuchinsky, M.B. Steer

Research output: Contribution to journalArticle

52 Citations (Scopus)
5 Downloads (Pure)

Abstract

An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz.
Original languageEnglish
Article number4682670
Pages (from-to)2717-2725
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume56
Issue number12
DOIs
Publication statusPublished - Dec 2008

Fingerprint

Intermodulation distortion
intermodulation
Microwaves
microwaves
Intermodulation
attenuators
Testing
nonlinearity
chips
spacing
slopes
Derivatives
formulations
Heating
heating
Networks (circuits)
products
Hot Temperature

Cite this

Wilkerson, J.R. ; Gard, K.G. ; Schuchinsky, Alexander ; Steer, M.B. / Electro-thermal theory of intermodulation distortion in lossy microwave components. In: IEEE Transactions on Microwave Theory and Techniques. 2008 ; Vol. 56, No. 12. pp. 2717-2725.
@article{01a18499ebd440bbbdb7466b74254f79,
title = "Electro-thermal theory of intermodulation distortion in lossy microwave components",
abstract = "An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz.",
author = "J.R. Wilkerson and K.G. Gard and Alexander Schuchinsky and M.B. Steer",
year = "2008",
month = "12",
doi = "10.1109/TMTT.2008.2007084",
language = "English",
volume = "56",
pages = "2717--2725",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "12",

}

Electro-thermal theory of intermodulation distortion in lossy microwave components. / Wilkerson, J.R.; Gard, K.G.; Schuchinsky, Alexander; Steer, M.B.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 12, 4682670, 12.2008, p. 2717-2725.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Electro-thermal theory of intermodulation distortion in lossy microwave components

AU - Wilkerson, J.R.

AU - Gard, K.G.

AU - Schuchinsky, Alexander

AU - Steer, M.B.

PY - 2008/12

Y1 - 2008/12

N2 - An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz.

AB - An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz.

UR - http://www.scopus.com/inward/record.url?scp=57849096618&partnerID=8YFLogxK

U2 - 10.1109/TMTT.2008.2007084

DO - 10.1109/TMTT.2008.2007084

M3 - Article

VL - 56

SP - 2717

EP - 2725

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

IS - 12

M1 - 4682670

ER -