Electro-thermal theory of intermodulation distortion in lossy microwave components

J.R. Wilkerson; K.G. Gard; Alexander Schuchinsky; M.B. Steer

doi:10.1109/TMTT.2008.2007084

Electro-thermal theory of intermodulation distortion in lossy microwave components

J.R. Wilkerson
, K.G. Gard
, Alexander Schuchinsky
, M.B. Steer

Research output: Contribution to journal › Article › peer-review

91 Citations (Scopus)

5 Downloads (Pure)

Abstract

An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz.

Original language	English
Article number	4682670
Pages (from-to)	2717-2725
Number of pages	9
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	56
Issue number	12
DOIs	https://doi.org/10.1109/TMTT.2008.2007084
Publication status	Published - Dec 2008

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics
Radiation

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10.1109/TMTT.2008.2007084

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abstract = "An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz. ",

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AU - Schuchinsky, Alexander

AU - Steer, M.B.

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AB - An analytic formulation of dynamic electro-thermally induced nonlinearity is developed for a general resistive element, yielding a self-heating circuit model based on a fractional derivative. The model explains the 10 dB/decade slope of the intermodulation products observed in two-tone testing. Two-tone testing at 400 MHz of attenuators, microwave chip terminations, and coaxial terminations is reported with tone spacing ranging from 1 to 100 Hz.

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DO - 10.1109/TMTT.2008.2007084

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JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

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ER -

Electro-thermal theory of intermodulation distortion in lossy microwave components

Abstract

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