Electromigration of vacancies in copper

J. Hoekstra, A.P. Sutton, Tchavdar Todorov, A.P. Horsfield

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)


The total current-induced force on atoms in a Cu wire containing a vacancy are calculated using the self consistent one-electron density matrix in the presence of an electric current, without separation into electron-wind and direct forces. By integrating the total current-induced force, the change in vacancy migration energy due to the current is calculated. We use the change in migration energy with current to infer an effective electromigration driving force F-e. Finally, we calculate the proportionality constant rho* between F-e and the current density in the wire.
Original languageEnglish
Pages (from-to)8568-8571
Number of pages4
JournalPhysical Review B (Condensed Matter)
Issue number13
Publication statusPublished - 01 Oct 2000

ASJC Scopus subject areas

  • Condensed Matter Physics


Dive into the research topics of 'Electromigration of vacancies in copper'. Together they form a unique fingerprint.

Cite this