Electromigration of vacancies in copper

J. Hoekstra; A.P. Sutton; Tchavdar Todorov; A.P. Horsfield

doi:10.1103/PhysRevB.62.8568

Electromigration of vacancies in copper

J. Hoekstra, A.P. Sutton, Tchavdar Todorov, A.P. Horsfield

School of Mathematics and Physics

Research output: Contribution to journal › Article › peer-review

30 Citations (Scopus)

Abstract

The total current-induced force on atoms in a Cu wire containing a vacancy are calculated using the self consistent one-electron density matrix in the presence of an electric current, without separation into electron-wind and direct forces. By integrating the total current-induced force, the change in vacancy migration energy due to the current is calculated. We use the change in migration energy with current to infer an effective electromigration driving force F-e. Finally, we calculate the proportionality constant rho* between F-e and the current density in the wire.

Original language	English
Pages (from-to)	8568-8571
Number of pages	4
Journal	Physical Review B (Condensed Matter)
Volume	62
Issue number	13
DOIs	https://doi.org/10.1103/PhysRevB.62.8568
Publication status	Published - 01 Oct 2000

ASJC Scopus subject areas

Condensed Matter Physics

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10.1103/PhysRevB.62.8568

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abstract = "The total current-induced force on atoms in a Cu wire containing a vacancy are calculated using the self consistent one-electron density matrix in the presence of an electric current, without separation into electron-wind and direct forces. By integrating the total current-induced force, the change in vacancy migration energy due to the current is calculated. We use the change in migration energy with current to infer an effective electromigration driving force F-e. Finally, we calculate the proportionality constant rho* between F-e and the current density in the wire.",

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AU - Todorov, Tchavdar

AU - Horsfield, A.P.

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N2 - The total current-induced force on atoms in a Cu wire containing a vacancy are calculated using the self consistent one-electron density matrix in the presence of an electric current, without separation into electron-wind and direct forces. By integrating the total current-induced force, the change in vacancy migration energy due to the current is calculated. We use the change in migration energy with current to infer an effective electromigration driving force F-e. Finally, we calculate the proportionality constant rho* between F-e and the current density in the wire.

AB - The total current-induced force on atoms in a Cu wire containing a vacancy are calculated using the self consistent one-electron density matrix in the presence of an electric current, without separation into electron-wind and direct forces. By integrating the total current-induced force, the change in vacancy migration energy due to the current is calculated. We use the change in migration energy with current to infer an effective electromigration driving force F-e. Finally, we calculate the proportionality constant rho* between F-e and the current density in the wire.

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DO - 10.1103/PhysRevB.62.8568

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ER -

Electromigration of vacancies in copper

Abstract

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