Electron attachment to 2-nitro-m-xylene

E. Alizadeh, Karola Graupner, Andreas Mauracher, A. Edtbauer, M. Probst, T.D. Mark, Thomas Field, P. Scheier, Sean Haughey

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Electron attachment to nitroaromatic compound 2-nitro-m-xylene in gas phase has been performed utilizing a double focusing two sector mass spectrometer with high mass resolution (m/Delta m approximate to 2500). At low energy (below 20 eV), electron interactions with the neutral 2-nitro-m-xylene molecule reveal a very rich fragmentation pattern. A total of 60 fragment anions have been detected and the ion yield for all observed negative ions has been recorded as a function of the incident electron energy, among them a long lived (metastable) non-dissociated parent anion which is formed at energies near zero eV, and some ions observed at the mass numbers 26,42 and 121. Comparison of calculated isotopic patterns with measured ion yields for these fragment anions and their successors in the mass spectrum, allows the assignment of the chemical composition of these fragments as CN- (26 Da), CNO- (42 Da) and C8H9O- (121 Da). Electron attachment to 2-nitro-m-xylene leads to anion formation at four energy ranges. Between 0 eV and 2 eV only few product ions are formed. Between 4.6 eV and 6.1 eV all fragment anions are formed and for most of them the anion yield reaches its maximum value in this range. NO2- which is the most abundant product [M-H](-) and O- are the only fragments that exhibit a feature at 7.4eV, 8.1 eV and 7.9eV, respectively. About half of the fragment anions exhibit a broad, mostly low-intensity resonance between 9 eV and 10 eV. (C) 2009 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)128-137
Number of pages10
JournalInternational Journal of Mass Spectrometry
Volume289
Issue number2-3
DOIs
Publication statusPublished - 15 Jan 2010

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Condensed Matter Physics
  • Instrumentation

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  • Cite this

    Alizadeh, E., Graupner, K., Mauracher, A., Edtbauer, A., Probst, M., Mark, T. D., Field, T., Scheier, P., & Haughey, S. (2010). Electron attachment to 2-nitro-m-xylene. International Journal of Mass Spectrometry, 289(2-3), 128-137. https://doi.org/10.1016/j.ijms.2009.10.003