Electronic characterisation of Ge MOSTs measured at low temperature

David McNeill, Yee Low, D. Tantraviwat, Paul Rainey, Paul Baine, Neil Mitchell, Mervyn Armstrong, Harold Gamble

Research output: Contribution to conference › Paper

Original language	English
Pages	0-0
Number of pages	1
Publication status	Published - Dec 2009
Event	Materials Ireland Conference - Cork, Ireland Duration: 01 Dec 2009 → 01 Dec 2009

Conference	Materials Ireland Conference
Country/Territory	Ireland
City	Cork
Period	01/12/2009 → 01/12/2009

Cite this

@conference{a976c274311844c7827331c9183b0dcd,

title = "Electronic characterisation of Ge MOSTs measured at low temperature",

author = "David McNeill and Yee Low and D. Tantraviwat and Paul Rainey and Paul Baine and Neil Mitchell and Mervyn Armstrong and Harold Gamble",

year = "2009",

month = dec,

language = "English",

pages = "0--0",

note = "Materials Ireland Conference ; Conference date: 01-12-2009 Through 01-12-2009",

}

TY - CONF

T1 - Electronic characterisation of Ge MOSTs measured at low temperature

AU - McNeill, David

AU - Low, Yee

AU - Tantraviwat, D.

AU - Rainey, Paul

AU - Baine, Paul

AU - Mitchell, Neil

AU - Armstrong, Mervyn

AU - Gamble, Harold

PY - 2009/12

Y1 - 2009/12

M3 - Paper

SP - 0

EP - 0

T2 - Materials Ireland Conference

Y2 - 1 December 2009 through 1 December 2009

ER -