Evidence for Strong Breit Interaction in Dielectronic Recombination of Highly Charged Heavy Ions

Nobuyuki Nakamura, Anthony P. Kavanagh, Hirofumi Watanabe, Hiroyuki A. Sakaue, Yueming Li, Daiji Kato, Fred J. Currell, Shunsuke Ohtani

Research output: Contribution to journalArticle

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Abstract

Resonant strengths have been measured for dielectronic recombination of Li-like iodine, holmium, and bismuth using an electron beam ion trap. By observing the atomic number dependence of the state-resolved resonant strength, clear experimental evidence has been obtained that the importance of the generalized Breit interaction (GBI) effect on dielectronic recombination increases as the atomic number increases. In particular, it has been shown that the GBI effect is exceptionally strong for the recombination through the resonant state [1s2s(2)2p(1/2)](1).
Original languageEnglish
Article number073203
Number of pages4
JournalPhysical Review Letters
Volume100
Issue number7
DOIs
Publication statusPublished - 22 Feb 2008

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heavy ions
holmium
bismuth
iodine
interactions
electron beams

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Nakamura, N., Kavanagh, A. P., Watanabe, H., Sakaue, H. A., Li, Y., Kato, D., ... Ohtani, S. (2008). Evidence for Strong Breit Interaction in Dielectronic Recombination of Highly Charged Heavy Ions. Physical Review Letters, 100(7), [073203]. https://doi.org/10.1103/PhysRevLett.100.073203
Nakamura, Nobuyuki ; Kavanagh, Anthony P. ; Watanabe, Hirofumi ; Sakaue, Hiroyuki A. ; Li, Yueming ; Kato, Daiji ; Currell, Fred J. ; Ohtani, Shunsuke. / Evidence for Strong Breit Interaction in Dielectronic Recombination of Highly Charged Heavy Ions. In: Physical Review Letters. 2008 ; Vol. 100, No. 7.
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Nakamura, N, Kavanagh, AP, Watanabe, H, Sakaue, HA, Li, Y, Kato, D, Currell, FJ & Ohtani, S 2008, 'Evidence for Strong Breit Interaction in Dielectronic Recombination of Highly Charged Heavy Ions', Physical Review Letters, vol. 100, no. 7, 073203. https://doi.org/10.1103/PhysRevLett.100.073203

Evidence for Strong Breit Interaction in Dielectronic Recombination of Highly Charged Heavy Ions. / Nakamura, Nobuyuki; Kavanagh, Anthony P.; Watanabe, Hirofumi; Sakaue, Hiroyuki A.; Li, Yueming; Kato, Daiji; Currell, Fred J.; Ohtani, Shunsuke.

In: Physical Review Letters, Vol. 100, No. 7, 073203, 22.02.2008.

Research output: Contribution to journalArticle

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AB - Resonant strengths have been measured for dielectronic recombination of Li-like iodine, holmium, and bismuth using an electron beam ion trap. By observing the atomic number dependence of the state-resolved resonant strength, clear experimental evidence has been obtained that the importance of the generalized Breit interaction (GBI) effect on dielectronic recombination increases as the atomic number increases. In particular, it has been shown that the GBI effect is exceptionally strong for the recombination through the resonant state [1s2s(2)2p(1/2)](1).

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