Evidence for two-phase regions in BST thin films from capacitance-voltage data

A.Q. Jiang, J.F. Scott, L.J. Sinnamon, Marty Gregg

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The Curie-Weiss plots of reciprocal dielectric constant versus temperature, in Ba0.5Sr0.5TiO3 films grown onto SrRuO3 lower electrodes by pulsed-laser deposition, show two minima below film thicknesses of 280 nm. This double minima implies possible mixed phases in the thin films. A graphical plot of capacitance for decreasing dc voltage versus that of increasing dc voltage shows a well-defined triangular shape for both Pb(Zr0.4Ti0.6)O-3 and SrBi2Ta2O9 thin films. However, for a 175-nm-thick Ba0.5Sr0.5TiO3 thin film, the plot shows an overlapping of two triangles, suggesting mixed phases. This graphical method appears to be effective in detecting structural subtleties in ferroelectric capacitors.
Original languageEnglish
Pages (from-to)3359-3361
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number16
DOIs
Publication statusPublished - 20 Oct 2003

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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