Evidence of plasma polarization shift of Ti He-alpha resonance line in high density laser produced plasmas

F. Y. Khattak*, O. A. M. B. Percie du Sert, F. B. Rosmej, D. Riley

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

A spectroscopic study of the He-alpha (1s(2) S-1(0) - 1s2p P-1(1)) line emission (4749.73 eV) from high density plasma was conducted. The plasma was produced by irradiating Ti targets with intense (I approximate to 1x10(19) W/cm(2)), 400nm wavelength high contrast, short (45fs) p-polarized laser pulses at an angle of 45 degrees. A line shift up to 3.4 +/- 1.0 eV (1.9 +/- 0.55 m angstrom) was observed in the He-alpha line. The line width of the resonance line at FWHM was measured to be 12.1 +/- 0.6 eV (6.7 +/- 0.35 m angstrom). For comparison, we looked into the emission of the same spectral line from plasma produced by irradiating the same target with laser pulses of reduced intensities (approximate to 10(17) W/cm(2)): we observed a spectral shift of only 1.8 +/- 1.0 eV (0.9 +/- 0.55m angstrom) and the line-width measures up to 5.8 +/- 0.25 eV (2.7 +/- 0.35 m angstrom). These data provide evidence of plasma polarization shift of the Ti He-alpha line.

Original languageEnglish
Title of host publicationXXI INTERNATIONAL CONFERENCE ON SPECTRAL LINE SHAPES (ICSLS 2012)
Place of PublicationBRISTOL
PublisherIOP PUBLISHING LTD
Number of pages6
DOIs
Publication statusPublished - 2012
Event21st International Conference on Spectral Line Shapes (ICSLS) - St Petersburg, United Kingdom
Duration: 03 Jun 201209 Jun 2012

Publication series

NameJournal of Physics Conference Series
PublisherIOP PUBLISHING LTD
Volume397
ISSN (Print)1742-6588

Conference

Conference21st International Conference on Spectral Line Shapes (ICSLS)
CountryUnited Kingdom
Period03/06/201209/06/2012

Keywords

  • ATOMIC-STRUCTURE
  • HYDROGEN LINES
  • ION LINES
  • HOT
  • ALUMINUM
  • EMISSION
  • PULSES
  • HELIUM
  • TRANSITIONS
  • PROFILES

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